Microfocused X-ray diffractometer with Imaging plate system

machine specifications:

• Microforcused X-ray diffractometer
  • X-ray generater
    • Rotating anode
    • Acceleration voltage : 20 ∼ 60 kV, Beam current : 10 ∼ 400 mA
    • Target : Cu, Cr, Mo
  • Goniometor
    • Movable angle range of sample : three axes ( ω = -90 ∼ +140 º, κ = -180 ∼ +180 º, φ = -180 ∼ +180 º)
  • Colimeter : 10, 30, 50, 100 μmφ
  • Control system : X-PRESS with Windows2000
    *Application software*
    -Phase identification
    -JCPDS card search
    -Crystal grain size and strain
    -Lattice parameter refinement
    -Rietveld analysis
• Imaging plate system
  • Type : cylindrical type (curvature: 150R)
  • Measured angle range : 2θ = 0 ∼ 150 º (reflection method), 2θ = -75 ∼ 75 º (transmission method)
  • Pixel size : 90 x 90 μm, Number of pixel : 4000 x 2000
  • System : X-PRESS with UNIX

applications:

• Identification of minerals in small natural and synthetic samples.

person(s) whom users should contact: Eiji ITO, Tomoo KATSURA, Takuya MATSUZAKI.