Scanning electron microscope JSM-T220A with EDS

machine specifications:

• Image : Secondary electron image (SEI), Backscattered electron image (BEI)
• Acceleration Voltage : 5∼30 kV
• Beam current : 10^-12∼10^-7 A
• Resolution : 4.5 nm (30 kV, Warking Distance 8 mm, SEI)
• Magnification : x15 (WD 48 mm)∼x200,000
• EDS system : QX200J (LINK)
• Analysis : Qualitative, Quantative

applications:

• Observation of micro-texture of minerals in natural and synthetic samples
• Analysis of chemical compositions

person(s) whom users should contact: Tomoo KATSURA, Takuya MATSUZAKI.